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化工儀器網(wǎng)>產(chǎn)品展廳>物理特性分析儀器>無損檢測>金屬檢測機(jī)>SMX-ILH 美國Solar System SMX-ILH

SMX-ILH 美國Solar System SMX-ILH

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我公司是一精密測試儀器代理商,服務(wù)對象為半導(dǎo)體生產(chǎn)行業(yè),PCB 生產(chǎn)行業(yè)及一般電鍍行業(yè)等. 我集團(tuán)在中國和香港地區(qū)*代理韓國MICRO PIONEER XRF-2000系列X-射線測厚儀及德國ROENTGENANALYTIK Compact eco系列X-射線測厚儀。此兩種儀器主要用于鍍層或涂層厚度的測量,而且特別適合于對微細(xì)表面積或超薄鍍層的測量。以下是我集團(tuán)的其他主要產(chǎn)品:
美國INNOVX伊諾斯XRF-6500 RoHS分析儀
美國OMEGA 600SMD離子污染測試儀
美國UPA / VEECO非破壞性厚度測試儀
美國WALCHEM(禾威)電鍍藥液自動添加系統(tǒng)
美國CECO PCB基材測試系統(tǒng)
美國ECI電鍍藥液分析系統(tǒng)
美國EXTEC研磨 / 拋光器材及消耗品
美國UNITRON工業(yè)用顯微鏡系統(tǒng)及表面光滑度測試儀
美國DICKSON溫濕度記錄儀
美國SPELLMAN 高壓電源供應(yīng)器
日本KETT磁感/高周波涂層測試儀
日本KYORITSU水質(zhì)離子測試包
英國JENWAY分光光度計
韓國SEC X-射線透視檢查儀
德國SCANDIA研磨 / 拋光器材及消耗品
德國WTW實驗室 / 工業(yè)用水質(zhì)檢查系統(tǒng)
俄羅斯PTH-1/ITM-52手提式線路板孔銅測厚儀
新加坡Qmax CIMS 特性阻抗測試儀  
 其次:我司一直來致力培養(yǎng)了一批高級維修工程師,對各類測厚類儀器、儀表,金相設(shè)備、控制器等都有很深的研究,如貴司有購買同類產(chǎn)品,歡迎來我司資詢技術(shù)問題。


鍍厚測厚儀;庫侖測厚儀;PH控制器;在線水質(zhì)分析;電鍍藥液分析;電鍍藥液;元素分析儀;孔銅測厚儀;銅箔測量儀;有害元素分析儀;水質(zhì)測試包

System SMX-ILH                             
In-Line XRF Solutions for Solar PV Thickness and Composition Analysis

如需更詳細(xì)資料或報價請資詢:
Web: www.eastco-hk。。com

System SMX-ILH is designed to perform in-line, post-process measurements. It readily accommodates both flexible substrates (such as stainless steel and polyimide) and rigid substrates (such as glass), and allows for control of blanket or patterned films. An available thermal shield extends SMX-ILH operational range to approximay 300C.

There are two primary ILH system configurations available, Open Beam and Closed Beam.

In an Open Beam system, the x-ray measurement head is inserted directly into your production line at a fixed location. Closed Beam units provide single or dual axis (X-Y) positioning of the x-ray head, enabling readings to be obtained on stationary or moving substrates.

An available Z-axis head drive lets you adjust on the fly for substrate height variations. Cross-process drive configurations are ideal for measuring gradients and profiles in film or composition across your substrate.

The SMX system control station (right) can be positioned adjacent to or remoy from the process, and enables you to control multiple Ethernet-connnected ILH x-ray measurement modules from a single location.

GENERAL SPECIFICATIONS (Subject to change)

Dimensions (Configuration-specific)

Weight (Configuration-specific)

X-Ray Generation  Microfocus Be window x-ray tube, 50W
  Available 75W generation column

Collimation Circular and rectangular collimators with up to five (5) primary filters available
Motorized Collimator Palette:  Standard on ILH Dual Closed Beam model; available for other ILH configurations.
(Please contact for details)
Single Collimator Option:  Standard on ILH Open Beam and Single-Axis Closed Beam models; available for other ILH configurations. (Please contact for details)

 X-Ray Detection Digital Signal Pulse Processing on all models
Proportional Counter:  Standard, ILH Open Beam; available, ILH Single-Axis Closed Beam
Silicon PIN Detector:  Standard, ILH Closed Beam; available, ILH Open Beam
Silicon Drift Detector (SDD): Available, all ILH models

Sample Positioning  
LED Sample Lighting
Contrast Auto-Focus (with camera-based systems)
Laser Triangulation Focus (with camera-based systems)

Stage/X-Ray Head Positioning  

ILH Open Beam: 
Z-axis x-ray head positioning system, 1” range. Available motorized programmable X-axis cross-line travel mount with range up to 50” (125 cm)

ILH Closed Beam (Single-Axis): 
16” (410 cm) X-axis linear motorized x-ray head positioning system; available 6” (15 cm) motorized Z-axis
ILH Closed Beam (Dual-Axis): Motorized XYZ x-ray head positioning system;
26” x 50” x 6” (66 x 127 x 15 cm) range

 Options
SDD Detection Column Upgrade Package;
Thermal Shield Protection Package;
Control Rack with Light Pole
 
Software 
Mira XRF Software platform with FP Analysis, Data Transfer Protocol, Ethernet
 


 



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